ULSI Semiconductor Technology Atlas . Chih-Hang Tung, George T. T. Sheng, Chih-Yuan Lu

ULSI Semiconductor Technology Atlas



Download ULSI Semiconductor Technology Atlas



ULSI Semiconductor Technology Atlas Chih-Hang Tung, George T. T. Sheng, Chih-Yuan Lu ebook pdf
Publisher: Wiley-Interscience
Language: English
Page: 671
ISBN: 0471457728, 9780471457725

"...provides a historical introduction to the technology as well as coverage of the evolution of basic ULSI process problems and issue." (IEEE Solid-State Circuits Society Newsletter, January 2004)

(E-Streams, Vol. 7, No. 4) More than 1,100 TEM images illustrate the science of ULSI

The first book available on the subject to be illustrated using TEM images, ULSI Semiconductor Technology Atlas is logically divided into four parts:Part I includes basic introductions to the ULSI process, device construction analysis, and TEM sample preparation Part II focuses on key ULSI modules—ion implantation and defects, dielectrics and isolation structures, silicides/salicides, and metallization Part III examines integrated devices, including complete planar DRAM, stacked cell DRAM, and trench cell DRAM, as well as SRAM as examples for process integration and development Part IV emphasizes special applications, including TEM in advanced failure analysis, TEM in advanced packaging development and UBM (Under Bump Metallization) studies, and high-resolution TEM in microelectronics

This innovative guide also provides engineers and managers in the microelectronics industry, as well as graduate students, with:More than 1,100 TEM images to illustrate the science of ULSIA historical introduction to the technology as well as coverage of the evolution of basic ULSI process problems and issuesDiscussion of TEM in other advanced microelectronics devices and materials, such as flash memories, SOI, SiGe devices, MEMS, and CD-ROMs

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